2019年8月1日 · High quality graphene oxide (GO) and reduced graphene oxide (rGO) have been synthesized by chemical oxidation of graphite flakes via three modified Hummers methods using a mixture of sulfuric acid (H 2 SO 4), phosphoric acid (H 3 PO 4) and nitric acid (HNO 3) as intercalating agents and potassium permanganate (KMnO 4) and hydrogen peroxide (H 2 ...

2022年5月15日 · XPS and ToF-SIMS are two main surface analysis techniques that have been used extensively and successfully to study the composition, structure, cleanliness, defects, and reactions of graphene and graphite surfaces. XPS is widely used to yield quantitative elemental and chemical state information of graphene and graphite surfaces.

2017年9月27日 · XPS: The Ideal Technique for Analyzing Graphene’s Surface X-ray photoelectron spectroscopy (XPS) is an ideal technique for characterizing a material’s surface chemistry with extreme selectivity. It can also identify chemical states on a surface, as well as measure the elemental composition, empirical formula, and electronic state of the ...

In this paper, we try to uncover the formation of GO and OD, and to analyze the structure of both and to propose a new structural model for GO layers. The model explains the origin of lactone peaks, the presence of defects and quinone groups, which have never been discussed in the literature before.

XPS spectra of graphene oxide and graphene. Graphene has attracted increasing attention because of its interesting properties. In this study, graphene was prepared from graphite by a...

REELS is a fast method for identifying graphene. XPS distinguishes between the graphene and adventitious carbon layers and provides their accurate thicknesses calculated using the PHI StrataPHI algorithm. GCIB is efficient at cleaning adventitious carbon from the surface of 2D materials without inducing damage to the materials themselves ...

2015年9月1日 · X-ray photoelectron spectroscopy (XPS) measurements of graphite oxide (GO) and reduced graphene oxide (rGO) were performed with a Kratos Axis Ultra electron spectrometer using monochromatic Al Kα source (1486.6 eV) operated at 225 W (15 kV, 15 mA).

Each obtained graphite oxide and reduced graphene oxide was analysed by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy (RS). Keywords: graphite, graphite oxide, reduced graphene oxide, modified Hummers method, oxidation, reduction, Raman spectroscopy

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.

2013年8月14日 · X-ray photoelectron spectroscopy (XPS) is among the most powerful methods to determine the surface chemical properties of carbon materials. Because heat-treated graphite oxide includes various defects, analyses of the structure by XPS help us understand the structures of various carbon materials.